User Contributed MET/CAL PROCEDURE ============================================================================= INSTRUMENT: SensitiveÿResearch SRI-SH:20A Shunt DATE: 05-Feb-96 AUTHOR: User Contributed REVISION: 0 ADJUSTMENT THRESHOLD: 70% NUMBER OF TESTS: 3 NUMBER OF LINES: 77 CONFIGURATION: Fluke 5700A CONFIGURATION: Fluke 5725A CONFIGURATION: Datron 1281 STANDARD: Leeds & Northrup 4223-B STANDARD: Thermo Electric MM II (1) STANDARD: Thermo Electric MM II (2) ============================================================================= STEP FSC RANGE NOMINAL TOLERANCE MOD1 MOD2 3 4 CON 1.001 ASK- R N P M F W 1.002 ASK+ X 1.003 HEAD ÍÍ INITIAL CONDITIONS ÍÍ 1.004 DISP The following standard test equipment is needed: 1.004 DISP Thermo Electric Micromite II 1.004 DISP Leeds & Northrup 4223-B 1.005 STD Leeds & Northrup 4223-B 1.006 OPBR Is the MM II's DTB number 25-30? 1.007 JMPF 1.010 1.008 STD Thermo Electric MM II (1) 1.009 JMP 1.011 1.010 STD Thermo Electric MM II (2) 1.011 DISP Connect the HI CURRENT OUTPUT from the Fluke 5725A 1.011 DISP to one of the large current terminals on the .001ê 1.011 DISP Leeds & Northrup Standard Resistor. 1.012 DISP Connect the other current terminal on the standard 1.012 DISP resistor to one of the current terminals on the UUT. 1.013 DISP Connect the other current terminal on the UUT 1.013 DISP to the LO CURRENT OUTPUT on the 5725A. 1.014 DISP Connect the potential terminals on the Leeds & Northrup 1.014 DISP resistor to the HI and LO front inputs on the 1281 DMM. 1.015 DISP Connect the potential terminals on the UUT to the 1.015 DISP rear CH B input on the 1281 DMM. 1.016 DISP Insert any thermocouple probe from the MM II 1.016 DISP into the center well or the standard resistor. 1.016 DISP 1.016 DISP Set the MM II to read the T/C selected in øC. 1.017 IEEE [@1281]*RST 1.018 IEEE [@1281]DCV AUTO;RESL7 1.019 5700 3A B1 S 2W 1.020 DISP Observe the Datron 1281, until the millivolt 1.020 DISP reading stabilizes. 1.021 CALL Standard Resistor Correction 1.022 MEME >3 1.023 HEAD {} 1.024 HEAD {ÉÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍ»} 1.025 HEAD {º Shunt Verification º} 1.026 HEAD {ÈÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍͼ} 1.027 HEAD ÍÍ Shunt Verification ÍÍ 1.028 JMP 2.001 1.029 EVAL 2.001 IEEE [D3000] 2.002 IEEE [@1281]RDG?[I] 2.003 MEME >1 2.004 IEEE [@1281]INPUT CH_B 2.005 IEEE [@1281]RDG?[I] 2.006 MEME >2 2.007 5700 * S 2.008 MATH m[1]=m[1]/m[3] 2.009 MATH m[2]=m[2]/m[1] 2.010 MATH mem=2.5 2.011 MATH mem1= m[2] 2.012 MATH mem1=mem1*1000 2.013 MEMC mZ 0.100000% ÿ3A 3.001 IEEE [@1281]*RST 3.002 HEAD {} 3.003 DISP {ÉÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍ»} 3.003 DISP {º THIS COMPLETES THE VERIFICATION º} 3.003 DISP {ÈÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍÍͼ} 3.004 END